The transverse resistivity among filaments is a crucial parameter of composite superconducting wires, since it affects the coupling losses in ac regime, the current transfer length of the wire subjected to bending strain, and the current redistribution among filaments in the case of a quench. A direct measurement of the transverse interfilament resistance as a function of temperature in several Nb{3} \hbox{Sn} multifilamentary wires was performed by means of a 4-probe method. This paper deals with the numerical analysis of the measurements performed on a OCSI wire manufactured by Luvata, containing 82 superconducting subelements each made of 150 filaments. The measurements are analyzed by applying a 2-D FEM of the wire cross-section and a 3-D electrical circuit model of the wire sample. The results obtained have been compared with those found on two other Nb{3}\hbox{Sn} wires with different architecture and a NbTi wire taken as a reference. © 2013 IEEE.
Experimental and numerical analysis of interfilament resistances in Nb 3Sn and NbTi strands
Corato, V.
2014-01-01
Abstract
The transverse resistivity among filaments is a crucial parameter of composite superconducting wires, since it affects the coupling losses in ac regime, the current transfer length of the wire subjected to bending strain, and the current redistribution among filaments in the case of a quench. A direct measurement of the transverse interfilament resistance as a function of temperature in several Nb{3} \hbox{Sn} multifilamentary wires was performed by means of a 4-probe method. This paper deals with the numerical analysis of the measurements performed on a OCSI wire manufactured by Luvata, containing 82 superconducting subelements each made of 150 filaments. The measurements are analyzed by applying a 2-D FEM of the wire cross-section and a 3-D electrical circuit model of the wire sample. The results obtained have been compared with those found on two other Nb{3}\hbox{Sn} wires with different architecture and a NbTi wire taken as a reference. © 2013 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
