Optically transparent LiF thin films thermally evaporated on glass and Si(100) substrates were used for advanced diagnostics of proton beams of energies from 1.4 to 7 MeV produced by a linear accelerator for protontheraphy under development at ENEA C.R. Frascati. The proton irradiation induces the formation of stable colour centres, among them the aggregate F2 and F3 + optically active defects. After exposure of LiF films grown on glass perpendicularly to the proton beams, their accumulated transversal spatial distributions were carefully measured by reading the latent two-dimensional (2-D) fluorescence images stored in the LiF thin layers by local formation of these broad-band visible light-emitting defects with an optical microscope under blue lamp excitation. Taking advantage from the low thickness of LiF thin films and from the linear behaviour of the integrated F2 and F3 + photoluminescence intensities up to the irradiation fluence of ∼5x1015 p/cm2, placing a cleaved LiF film grown on Si substrate with the cutted edge perpendicular to the proton beam, the 2-D fluorescence image of the film surface could allow to obtain the depth profile of the energy released by protons, which mainly lose their energy at the end of the path. © Published under licence by IOP Publishing Ltd.

Lithium fluoride thin film detectors for low-energy proton beam diagnostics by photoluminescence of colour centres

Vincenti, M.A.;Piccinini, M.;Nichelatti, E.;Libera, S.;Bonfigli, F.;Ronsivalle, C.;Picardi, L.;Ampollini, A.;Montereali, R.M.
2017

Abstract

Optically transparent LiF thin films thermally evaporated on glass and Si(100) substrates were used for advanced diagnostics of proton beams of energies from 1.4 to 7 MeV produced by a linear accelerator for protontheraphy under development at ENEA C.R. Frascati. The proton irradiation induces the formation of stable colour centres, among them the aggregate F2 and F3 + optically active defects. After exposure of LiF films grown on glass perpendicularly to the proton beams, their accumulated transversal spatial distributions were carefully measured by reading the latent two-dimensional (2-D) fluorescence images stored in the LiF thin layers by local formation of these broad-band visible light-emitting defects with an optical microscope under blue lamp excitation. Taking advantage from the low thickness of LiF thin films and from the linear behaviour of the integrated F2 and F3 + photoluminescence intensities up to the irradiation fluence of ∼5x1015 p/cm2, placing a cleaved LiF film grown on Si substrate with the cutted edge perpendicular to the proton beam, the 2-D fluorescence image of the film surface could allow to obtain the depth profile of the energy released by protons, which mainly lose their energy at the end of the path. © Published under licence by IOP Publishing Ltd.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12079/3438
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