We propose the use of Electronic Speckle Pattern Interferometry for high resolution calibration of FBG sensors stuck on the structure to be monitored. Experimental results obtained with a specimen are reported. © 2002 IEEE.

Use of ESPI for absolute high resolution calibration of FBG sensors

Caponero, M.A.
2002

Abstract

We propose the use of Electronic Speckle Pattern Interferometry for high resolution calibration of FBG sensors stuck on the structure to be monitored. Experimental results obtained with a specimen are reported. © 2002 IEEE.
0780372891; 9780780372894
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.12079/3756
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