We propose the use of Electronic Speckle Pattern Interferometry for high resolution calibration of FBG sensors stuck on the structure to be monitored. Experimental results obtained with a specimen are reported. © 2002 IEEE.
Use of ESPI for absolute high resolution calibration of FBG sensors
Caponero, M.A.
2002-01-01
Abstract
We propose the use of Electronic Speckle Pattern Interferometry for high resolution calibration of FBG sensors stuck on the structure to be monitored. Experimental results obtained with a specimen are reported. © 2002 IEEE.File in questo prodotto:
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