Indium Tin Oxide (ITO) is widely used in solar cell devices for its excellent electrical and optical characteristics, such as high transparency in the Ultraviolet-Visible range and good conductivity (around 104W-1cm-1). In this work we have compared thin (70-150 nm) ITO layers deposited by Direct Current or Radio Frequency sputtering. We have used different substrate temperatures during film growthand have afterwards thermally annealed the samples at different temperatures up to 300 °C to investigate the effects on the electrical and optical properties of the material. We have found out that the different growth/annealing conditions induce changes in the optical properties of the samples as well as in the conductivity and carrier concentration. © 2018 IEEE.
|Titolo:||Temperature effects on sputtered ITO|
|Data di pubblicazione:||2018|
|Appare nelle tipologie:||4.1 Contributo in Atti di convegno|