Local fluorescent probes based on low-energy electron beam irradiated lithium fluoride (LiF) thin films were preparated and tested for their applications in Scanning Near-Field Optical Microscopy. © 2004 American Institute of Physics.

Point Light Sources Based on Color Centers in LiF Films for Scanning Near-Field Optical Microscopy

Santoni, A.;Montereali, R.M.;Loreti, S.;Bonfigli, F.
2004

Abstract

Local fluorescent probes based on low-energy electron beam irradiated lithium fluoride (LiF) thin films were preparated and tested for their applications in Scanning Near-Field Optical Microscopy. © 2004 American Institute of Physics.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.12079/4864
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