In this work, we combined AFM, FE-SEM and Raman spectroscopy to study the commercially available CVD grown graphene on Cu and Si substrate. SEM and AFM provide topographic information, show a network of out of plane deformations, 'wrinkles', whereas Raman spectroscopy which can give information on structural properties of the graphene films, such as the number of layers and level of disorder, by observing the peaks, indicates a I2D/IG ratio smaller than the value expected for mono-layer graphene. © 2018 Author(s).
|Titolo:||Investigation of CVD grown graphene topography|
|Data di pubblicazione:||2018|
|Appare nelle tipologie:||4.1 Contributo in Atti di convegno|