We have compared different Ag-based back reflectors (BRs) applied to superstrate-type microcrystalline Si devices grown on Asahi U glass. In particular, substitution of the conventional ZnO:Al layer by MgF2, with lower refractive index and no free-carrier absorption, has been investigated. As electrical issues can mask the optical performance of the BR when evaluated by EQE measurements, a purely optical method that compares the intensity of Raman spectra generated with long wavelength excitation light has been applied. Based on this investigation, MgF2/Ag is potentially superior to ZnO:Al/Ag, even when MgF2 is used in the form of ultrathin layer (few nm, likely island-like). Nevertheless, the novel dual-function n-SiOx/Ag BR outperforms all the other BRs. © 2015 The Authors.
Titolo: | Optical Performance of Ag-based Back Reflectors with different Spacers in Thin Film Si Solar Cells |
Autori: | |
Data di pubblicazione: | 2015 |
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Handle: | http://hdl.handle.net/20.500.12079/4946 |
Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |