We present the study of optical and spectral properties of radiation-induced stable point defects, known as color centers (CCs), in lithium fluoride (LiF) for the detection of 10 keV XFEL beam at Spring-8 Angstrom Compact free electron LAser (SACLA) in Japan. A thick LiF crystal was irradiated in four spots with 10 keV XFEL beam (pulse duration = 10 fs) with different number of accumulated shots. After irradiation the colored-LiF spots were characterized with an optical microscope in fluorescence mode and their photoluminescence intensity and spectra were analyzed.
|Titolo:||Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam|
|Data di pubblicazione:||2019|
|Appare nelle tipologie:||4.1 Contributo in Atti di convegno|