We present the study of optical and spectral properties of radiation-induced stable point defects, known as color centers (CCs), in lithium fluoride (LiF) for the detection of 10 keV XFEL beam at Spring-8 Angstrom Compact free electron LAser (SACLA) in Japan. A thick LiF crystal was irradiated in four spots with 10 keV XFEL beam (pulse duration = 10 fs) with different number of accumulated shots. After irradiation the colored-LiF spots were characterized with an optical microscope in fluorescence mode and their photoluminescence intensity and spectra were analyzed.
Titolo: | Photoluminescence properties and characterization of LiF-based imaging detector irradiated by 10 keV XFEL beam |
Autori: | |
Data di pubblicazione: | 2019 |
Serie: | |
Handle: | http://hdl.handle.net/20.500.12079/54413 |
ISBN: | 9781510627369 9781510627376 |
Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
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