The optical properties of room temperature sputter-deposited metal oxide films on fused silica substrates are investigated by in situ spectroscopic ellipsometry over a wide temperature range. © OSA 2016.

Ellipsometric monitoring of the refractive index evolution versus temperature for various metal oxides commonly used in interference filters

Grilli, M.L.;Sytchkova, A.
2016

Abstract

The optical properties of room temperature sputter-deposited metal oxide films on fused silica substrates are investigated by in situ spectroscopic ellipsometry over a wide temperature range. © OSA 2016.
9781943580132
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.12079/5682
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