We report radiation hardness tests performed, with a white neutron beam, at the Geel Electron LINear Accelerator in Belgium on silicon Photo-Multipliers. These are semiconductor photon detectors made of a square matrix of Geiger-Mode Avalanche photo-diodes on a silicon substrate. Several samples from different manufacturers have been irradiated integrating up to about 6.2 × 10 9 1-MeV-equivalent neutrons per cm2. © 2013 IEEE.

Silicon photo-multiplier radiation hardness tests with a white neutron beam

Pietropaolo, A.
2013

Abstract

We report radiation hardness tests performed, with a white neutron beam, at the Geel Electron LINear Accelerator in Belgium on silicon Photo-Multipliers. These are semiconductor photon detectors made of a square matrix of Geiger-Mode Avalanche photo-diodes on a silicon substrate. Several samples from different manufacturers have been irradiated integrating up to about 6.2 × 10 9 1-MeV-equivalent neutrons per cm2. © 2013 IEEE.
9781479910472
radiation hardness;Silicon Photomultipliers;neutron damage
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12079/6092
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