Smooth ultrathin transparent conductive Ni films were fabricated by radio frequency sputtering at room temperature. A novel method based on angle resolved transmittance and reflectance measurements allowed calculation of films optical constants. © OSA 2016.

Optical and electrical characteristics of transparent and highly conductive ultrathin nickel films

Piegari, A.;Grilli, M.L.
2016-01-01

Abstract

Smooth ultrathin transparent conductive Ni films were fabricated by radio frequency sputtering at room temperature. A novel method based on angle resolved transmittance and reflectance measurements allowed calculation of films optical constants. © OSA 2016.
2016
9781943580132
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12079/6111
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