Lithium fluoride (LiF) polycrystalline thin films grown on glass substrates by thermal evaporation were characterised by means of Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM ), optical transmittance and reflectance spectra and X-Ray Diffraction (XRD). A theoretical model was used to evaluate from measured photometric spectra some properties of the coating, such as film thickness, superficial roughness, material inhomogeneity along the growth axis, etc.. Optical absorption, photoluminescence and photo-excitation spectra of LiF thin films of increasing thicknesses were measured before and after irradiation with a 5 MeV electron beam. The Combined Excitation-Emission Spectroscopy (CEES) technique was successfully applied to investigate the kind of colour centres produced in these thin films by beta irradiation. Luminescent LiF thin films are currently under study as novel and versatile imaging detectors of high-energy radiation beams and other radiation sources.
Film sottili policristallini di fluoruro di litio (LiF) depositati per evaporazione termica su substrati di vetro sono stati caratterizzati mediante Microscopia a Forza Atomica (AFM), Microscopia Elettronica a Scansione (SEM), spettri di trasmittanza e riflettanza ottica e Diffrazione a Raggi X (XRD). E’ stato utilizzato un modello teorico per valutare da misure spettrofotometriche alcune proprietà dello strato depositato, come lo spessore del film, la rugosità superficiale, la disomogeneità del materiale lungo l’asse di crescita, ecc.. Gli spettri di assorbimento ottico, di fotoluminescenza e di fotoeccitazione dei film sottili di LiF di diverso spessore sono stati misurati prima e dopo l’irraggiamento con un fascio di elettroni da 5 MeV. La tecnica di Spettroscopia Combinata di Eccitazione-Emissione (CEES) è stata applicata con successo per studiare il tipo di centri di colore prodotti dall’irraggiamento beta in questi film. Film sottili luminescenti di LiF sono attualmente oggetto di studio come rivelatori a lettura ottica, innovativi e versatili, di fasci di radiazione ad alta energia e di altre sorgenti di radiazione ionizzante.
Growth and characterisation of thermally-evaporated lithium fluoride thin films for high-energy radiation detectors
Rufoloni, Alessandro;Mancini, Antonella;Nichelatti, Enrico;Messina, Giuseppe;Montereali, Rosa Maria;Vincenti, Maria Aurora
2014-01-01
Abstract
Lithium fluoride (LiF) polycrystalline thin films grown on glass substrates by thermal evaporation were characterised by means of Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM ), optical transmittance and reflectance spectra and X-Ray Diffraction (XRD). A theoretical model was used to evaluate from measured photometric spectra some properties of the coating, such as film thickness, superficial roughness, material inhomogeneity along the growth axis, etc.. Optical absorption, photoluminescence and photo-excitation spectra of LiF thin films of increasing thicknesses were measured before and after irradiation with a 5 MeV electron beam. The Combined Excitation-Emission Spectroscopy (CEES) technique was successfully applied to investigate the kind of colour centres produced in these thin films by beta irradiation. Luminescent LiF thin films are currently under study as novel and versatile imaging detectors of high-energy radiation beams and other radiation sources.File | Dimensione | Formato | |
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