This work, part of an agreement between ENEA SSPT-MET-ISPREV and ALMA Elettronica, Bologna, focusses on a study on elastomeric O-rings. Part of a batch of such materials were mounted on cooling fans inside electrical devices, and showed severe damages after a normal work cycle. A morphological and semi quantitative EDS analysis has been carried out on several specimens of brand new and damaged samples, with the goal to assess a possible cause for their behaviour.

Scanning electron microscopy and microanalysis on elastomeric O-rings

Gessi, Alessandro;Bruni, Stefania
2017

Abstract

This work, part of an agreement between ENEA SSPT-MET-ISPREV and ALMA Elettronica, Bologna, focusses on a study on elastomeric O-rings. Part of a batch of such materials were mounted on cooling fans inside electrical devices, and showed severe damages after a normal work cycle. A morphological and semi quantitative EDS analysis has been carried out on several specimens of brand new and damaged samples, with the goal to assess a possible cause for their behaviour.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12079/7950
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