This work, part of an agreement between ENEA SSPT-MET-ISPREV and ALMA Elettronica, Bologna, focusses on a study on elastomeric O-rings. Part of a batch of such materials were mounted on cooling fans inside electrical devices, and showed severe damages after a normal work cycle. A morphological and semi quantitative EDS analysis has been carried out on several specimens of brand new and damaged samples, with the goal to assess a possible cause for their behaviour.
|Titolo:||Scanning electron microscopy and microanalysis on elastomeric O-rings|
|Data di pubblicazione:||7-feb-2017|
|Appare nelle tipologie:||5.2 Documento in Garanzia della Qualità|