Novel X-ray imaging detectors based on photoluminescence of colour centres in lithium fluoride (LiF) have been proposed and tested for extreme ultraviolet, soft and hard X-rays up to 10 keV. For the first time we present the optical characterisation of LiF crystals and thin films irradiated at the TOPO-TOMO beamline of synchroton light source Anka (Karlsruhe, Germany) in the energy range 6-40 keV for different exposure times. Absorption and photoluminescence spectra were analysed to study the optical response of the LiF-based detectors. High resolved X-ray imaging of commercial test patterns has been obtained on LiF crystals and films by optical readout with a confocal laser scanning fluorescence microscope. © 2012 Elsevier B.V.
|Titolo:||Optical characterisation of lithium fluoride detectors for broadband X-ray imaging|
|Data di pubblicazione:||2013|
|Appare nelle tipologie:||1.1 Articolo in rivista|