Among the transparent conductor, one of themost interesting is the Al doped MgxZn1-xO films for their electrical properties that make it very attracting for solar cell application. In thiswork, the Mg distribution in Al doped MgxZn1-xO films was investigated in order to find a reliable methods to determine Mg distribution. In particular, X-ray diffraction, Auger electron spectroscopy and time of flight secondary ion mass spectrometry were used to characterize the film. Time of flight secondary ion mass spectrometry MCs+ results appear to be the most promising analytical technique.
|Titolo:||Determination of Mg concentration and distribution in MgxZn1-xO films for photonic devices application|
|Data di pubblicazione:||2014|
|Appare nelle tipologie:||1.1 Articolo in rivista|