To test the sensitivity of our CR-39 alpha-track detector thoron passive device (ATD-TnPD), a closed-circuit exposure facility, composed by a new thoron source, a small exposure chamber and a new absolute 220Rn active monitor (TnM), was set up. 220Rn exposure was evaluated by assessing the TnM response and its combined uncertainty. The ATD-TnPD's sensitivity was determined by three thoron exposures, tested at different etching times. A non-linear relationship on etching conditions was obtained, with values in the range 1.54-1.76 (tracks cm2)(kBq h m-3)-1.
Titolo: | How to Assess the Sensitivity and Related Uncertainty of a New Solid State Passive Thoron Measuring Device |
Autori: | |
Data di pubblicazione: | 1-mag-2009 |
Handle: | http://hdl.handle.net/20.500.12079/509 |
Appare nelle tipologie: | 1.1 Articolo in rivista |
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