Lithium fluoride (LiF) films and crystals are versatile X-ray imaging detectors based on the optical reading of visible photoluminescence from radiation-induced electronic defects. Distinctive features of these detectors are their high spatial resolution across a large field of view, wide dynamic range and insensitivity to ambient light. These peculiarities of LiF detectors appear to be promising for monitoring the spatial intensity distribution of ultra-short, ultra-high pulses of the EUV-X-ray Free Electron Laser (XFEL) and could be exploited for coherent diffraction imaging experiments.

Imaging detectors based on photoluminescence of radiation-induced defects in lithium fluoride for XFEL beam monitoring

Bonfigli F.;Giannessi L.;Montereali R. M.;Nichelatti E.;Vincenti M. A.;
2019

Abstract

Lithium fluoride (LiF) films and crystals are versatile X-ray imaging detectors based on the optical reading of visible photoluminescence from radiation-induced electronic defects. Distinctive features of these detectors are their high spatial resolution across a large field of view, wide dynamic range and insensitivity to ambient light. These peculiarities of LiF detectors appear to be promising for monitoring the spatial intensity distribution of ultra-short, ultra-high pulses of the EUV-X-ray Free Electron Laser (XFEL) and could be exploited for coherent diffraction imaging experiments.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.12079/53885
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