Photoluminescent Bragg curves in lithium fluoride thin films on silicon substrates irradiated with a 35 MeV proton beam

Proton irradiation of lithium fluoride (LiF) crystals and thin films causes the formation of electronic defects, known as color centers, in the crystal lattice, some of which show photoluminescence in the visible range under blue-light excitation. With a suitable irradiation geometry, the energy density that protons deposit in the material can be recorded as a spatial distribution of these light-emitting color centers, from which a luminous replica of the proton Bragg curve can be thereafter extracted and analyzed in a fluorescence microscope. In this paper, the cases of two LiF thin films deposited on silicon substrates and of a LiF crystal, all of them transversally irradiated with a nominal 35 MeV proton beam, are considered. A comparison of the measured photoluminescent Bragg curves with Monte Carlo simulations demonstrates (i) that the Bragg peaks in the films are located at the very same positions that would be expected in the underlying silicon substrates rather than in LiF and (ii) that an even small grazing angle of the impinging proton beam is able to significantly modify the shape of the Bragg curve in the films. Both of these findings are ascribed to the effects of multiple Coulomb scattering in both the film and the substrate. The coincidence of the Bragg peak positions with those expected in the silicon substrates and the possibility of visualizing such peaks in the Bragg curves stored as latent fluorescence images in the LiF films allow one to regard them as information transducers for proton beam diagnostics and dosimetry.